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Active standard | Published: 31/12/2021
GB/T 41064-2021
Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 368.80 EUR
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Detail information
Designation: GB/T 41064-2021
Publication date: 31/12/2021
Pages: 0
Country: Chinese technical standard
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