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Active standard | Published: 12/10/2022
GB/T 41751-2022
Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 226.80 USD
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Detail information
Designation: GB/T 41751-2022
Publication date: 12/10/2022
Pages: 0
Country: Chinese technical standard
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