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Active standard | Published: 06/08/2023
GB/T 42902-2023
Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 322.80 USD
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Detail information
Designation: GB/T 42902-2023
Publication date: 06/08/2023
Pages: 0
Country: Chinese technical standard
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