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Active standard | Published: 05/11/2012
GB/T 4937.4-2012
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 164.80 EUR
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Detail information
Designation: GB/T 4937.4-2012
Publication date: 05/11/2012
Pages: 0
Country: Chinese technical standard
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