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Active standard | Published: 02/12/2025
GB/T 4937.44-2025
Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Available languages: English, Chinese
Available design: electronic design (pdf), Print design
from 400.20 EUR
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Detail information
Designation: GB/T 4937.44-2025
Publication date: 02/12/2025
Pages: 0
Country: Chinese technical standard
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