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Active standard | Published: 01/03/2025
GOST R 71422-2024
The epitaxial structures and dielectric films. Method for measuring the thickness of gallium arsenide epitaxial layers based on a spherical section
Available languages: English and Russian, Russian
Available design: electronic design (pdf), Print design
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Detail information
Designation: GOST R 71422-2024
Publication date: 01/03/2025
Pages: 12
Country: Russian technical standard
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