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Active standard | Published: 26/08/2025
IEC/TR 62433-4-1-ed.1.0
EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 8 145.40 CZK
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Detail information
Designation: IEC/TR 62433-4-1-ed.1.0
Publication date: 26/08/2025
Pages: 40
Country: International technical standard
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IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB. This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.Popular Publishers
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