Active standard | Published: 10/09/2007

IEC/TS 62215-2-ed.1.0

Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC/TS 62215-2-ed.1.0

Publication date: 10/09/2007

Pages: 27

Country: International technical standard

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Anotation

Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured

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