IEC/TS 62351-100-4-ed.1.0

Detail information

Designation: IEC/TS 62351-100-4-ed.1.0

Publication date: 27/11/2023

Pages: 0

Country: International technical standard

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Anotation

IEC TS 62351-100-4:2023, which is a technical specification, describes test procedures for interoperability conformance testing of data and communication security for power system automation and protection systems which implement MMS, IEC 61850-8-1 (MMS), IEC 61850-8-2 (XMPP) or any other protocol implementing IEC 62351-4:2018/AMD1:2020. The tests described in this document cover only E2E security testing and do not evaluate A-security profile implementation. Thus, citing conformance to this document does not imply that any particular security level has been achieved by the corresponding product, or by the system in which it is used. The goal of this document is to enable interoperability by providing a standard method of testing protocol implementations, but it does not guarantee the full interoperability of devices. It is expected that using this document during testing will minimize the risk of non interoperability. Additional testing and assurance measures will be required to verify that a particular implementation of IEC 62351-4:2018/AMD1:2020 has correctly implemented all the security functions and that they can be assured to be present in the delivered products. This topic is covered in other IEC standards, for example IEC 62443. The scope of this document is to specify available common procedures and definitions for conformance and/or interoperability testing of IEC 62351-4:2018/AMD1:2020. This document deals mainly with cyber security conformance testing; therefore, other requirements, such as safety or EMC are not covered. These requirements are covered by other standards (if applicable) and the proof of compliance for these topics is done according to these standards. T-profile testing is to be performed prior to E2E security profile testing. T-profile testing is described in IEC 62351-100-3 in the context of IEC 61850-8-1. T-profile testing for IEC 61850-8-2 is to be described in the corresponding IEC 61850-8-2 test specification.