Active standard | Published: 27/10/2020

IEC/TS 62607-6-14-ed.1.0

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

from 308.30 USD show on eshop

Detail information

Designation: IEC/TS 62607-6-14-ed.1.0

Publication date: 27/10/2020

Pages: 28

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic • defect level for powders consisting of graphene-based material by • Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D band and 2D band in Raman spectrum, ID+D/I2D. • The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder. • The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene. • Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users. • The method described in this document is appropriate if the physical form of graphene is powder.

Popular Publishers

full catalog