Active standard | Published: 29/08/2018

IEC/TS 62876-2-1-ed.1.0

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC/TS 62876-2-1-ed.1.0

Publication date: 29/08/2018

Pages: 30

Country: International technical standard

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Anotation

IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

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