Active standard | Published: 27/03/2015

IEC/TS 62878-2-4-ed.1.0

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
(Substrat avec appareil(s) integre(s) - Partie 2-4: Directives - Groupes d´elements d´essai (TEG))

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC/TS 62878-2-4-ed.1.0

Publication date: 27/03/2015

Pages: 75

Country: International technical standard

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Anotation

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components. LIEC TS 62878-2-4:2015 decrit les appareils du groupe delements dessai utiles pour mesurer les proprietes de base des substrats avec appareil(s) integre(s). Il est applicable aux substrats avec appareil(s) integre(s) fabriques a partir de materiaux de base organiques, y compris par exemple les appareils actifs ou passifs, les composants discrets formes lors du processus de fabrication dune carte de cablage electronique, ainsi que les composants de feuilles minces.

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