IEC 60115-1-ed.5.0

Detail information

Designation: IEC 60115-1-ed.5.0

Publication date: 18/03/2020

Pages: 322

Country: International technical standard

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Anotation

IEC 60115-1:2020 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition contains the following significant technical changes with respect to the previous edition: this 5th edition employs a new document structure, where the tests of prior Clause 4 are given in Clauses 6 to 12 now, with an informative Annex X providing cross-references for references to the prior revision of this standard; the terms and definitions have been revised and amended, supplemented by a new section on resistor technologies and a new section on product classification levels; a new Subclause 4.7 on recommendations for permissible substitutions has been added; the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have been completely revised; a new Subclause 5.3 on default tolerances for the most common test parameters has been added; the generic method of measuring resistance, now Sublause 5.6, has been separated from the test for compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5; the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior test 4.8, variation of resistance with temperature, where the special concessions for resistors below 10 ohm have been waived; the test methods for endurance testing of Subclauses 7.1 to 7.3 (prior 4.25.1 to 4.25.3) have been completely revised; the single-pulse high-voltage overload test of Subclause 8.2 (prior 4.27) has been completely revised, and now offers adjustable severities for the 1,2/50 and for the 10/700 pulse shape for the benefit of detail specifications with improved significance; the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and a corrected table of severities provided; the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and streamlined to only offer the severity historically applied in subordinate specifications; the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the assessment of detail dimensions (all parts of prior 4.4) have been completely revised; the tests for robustness of terminations (prior 4.16) have been revised and separated into tests for the robustness of solderable terminations, Subclause 9.5, and tests for the robustness of threaded stud or screw terminations, Subclause 9.6; the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21) have been revised to reflect the merged relevant test standard IEC 60068-2-29; the dry heat and cold test of the climatic sequence of Subclause 10.3 (prior 4.23) have been revised to reflect the changes of the relevant test standards IEC 60068-2-2 and IEC 60068-2-1; the accelerated damp heat, steady state test of Subclause 10.5 (prior 4.37) has been amended with an option for a reduced number of bias voltages; the corrosion test of Subclause 10.6 has been completely revised in order to employ the better suitable test method of IEC 60068-2-52 instead of the prior used IEC 60068-2-11; the whisker growth test of Subclause 10.7 has been revised to reflect the changes of the new revision of the test methods of IEC 60068-2-82; the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering heat of Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary option for the variety of lead-bearing and lead-free solder alloys and respective process conditions; the solvent resistance test of Subclause 11.3 combines the prior tests 4.29, component solvent resistance, and 4.30, solvent resistance of marking, in one test; the accidental overload test of Subclause 12.3 (prior 4.26) has been completely revised; the Annex Q on quality assessment procedures has been completely revised; a new Annex R on failure rate evaluation, determination and qualification has been added. LIEC 60115-1:2020 est une specification generique et sapplique aux resistances fixes utilisees dans les equipements electroniques. Elle definit les termes normalises, les procedures dexamen et les methodes dessai utilises dans les specifications intermediaires et particulieres des composants electroniques dans le cadre de lassurance qualite, ainsi qua dautres fins. Cette edition contient les modifications techniques majeures suivantes par rapport a ledition precedente: cette 5e edition sappuie sur une nouvelle structure de document, dans laquelle les essais du precedent Article 4 sont desormais presentes de lArticle 6 a lArticle 12, avec une Annexe X informative donnant des references croisees vers la version precedente de la presente norme; les termes et definitions ont ete revises et amendes, completes par une nouvelle section relative aux technologies en matiere de resistance et une nouvelle section relative aux niveaux de classification des produits; un nouveau Paragraphe 4.7 relatif aux recommandations en matiere de remplacements admis a ete ajoute; les dispositions en matiere demballage, de stockage et de transport de 4.8, 4.9 et 4.10 ont ete integralement revisees; un nouveau Paragraphe 5.3 relatif aux tolerances par defaut pour la plupart des parametres dessai habituels a ete ajoute; la methode generique de resistance de mesure (5.6 desormais) a ete separee de lessai pour des raisons de conformite avec une valeur de resistance specifiee en 6.1, en revision du precedent 4.5; lessai de coefficient de temperature de resistance de 6.2 est une revision du precedent essai de 4.8 (Variation de la resistance avec la temperature), des concessions particulieres sur les resistances inferieures a 10 ohm ayant ete consenties; les methodes dessai dendurance de 7.1 a 7.3 (precedemment 4.25.1 a 4.25.3) ont e