Active standard | Published: 01/01/1980

IEC 60444-2-ed.1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
(Mesure des parametres des quartz piezoelectriques par la technique de phase nulle dans le circuit en pi. Deuxieme partie: Methode de decalage de phase pour la mesure de la capacite dynamique des quartz)

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Detail information

Designation: IEC 60444-2-ed.1.0

Publication date: 01/01/1980

Pages: 18

Country: International technical standard

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Anotation

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. Decrit une methode de mesure de la capacite dynamique des quartz dans une gamme de frequences de 1 MHz a 125 MHz avec une erreur totale de mesure de lordre de 5%.

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