IEC 60747-1-ed.2.0

Detail information

Designation: IEC 60747-1-ed.2.0

Publication date: 21/02/2006

Pages: 89

Country: International technical standard

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Anotation

IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below: a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted. b) There has been a general revision of guidance on essential ratings and characteristics. c) The distinction between general and reference methods of measurement has been removed. d) A clause on product discontinuation notice has been added. La CEI 60747-1:2006 specifie les exigences generales applicables aux dispositifs discrets a semiconducteurs et aux circuits integres couverts par les autres parties de la CEI 60747 et de la CEI 60748 (voir Annexe A). Cette deuxieme edition de la CEI 60747-1 annule et remplace la premiere edition (1983) et ses amendements 1 (1991), 2 (1993) et 3 (1996). Les principaux changements par rapport a ledition precedente sont enumeres ci-dessous: a) La terminologie figurant actuellement dans le VEI (ou qui etait en contradiction avec le VEI) a ete omise. b) Les lignes directrices relatives aux valeurs limites et caracteristiques essentielles ont fait lobjet dune revision generale. c) La distinction entre methodes de mesure generales et de reference a ete supprimee. d) Un article relatif a lannonce de suppression dun produit a ete ajoute.