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Active standard | Published: 13/08/2003
IEC 60749-11-ed.1.0/Cor.2 Correction
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
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Detail information
Designation: IEC 60749-11-ed.1.0/Cor.2
Publication date: 13/08/2003
Pages: 0
Note: Correction
Country: International technical standard
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Modification of the validity date: now put at 2007. Modification de la date de validite : fixee maintenant a 2007.Popular Publishers
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