IEC 60749-11-ed.1.0

Detail information

Designation: IEC 60749-11-ed.1.0

Publication date: 12/04/2002

Pages: 13

Country: International technical standard

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Anotation

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy. Definit la methode dessai de variations rapides de temperature et la methode des deux bains. Cette derniere methode dessai peut egale-ment etre utilisee, en appliquant moins de cycles, pour determiner leffet de limmersion dans des liquides chauds qui est utilisee pour le nettoyage des dispositifs. Cet essai est applicable a tous les dispositifs a semiconducteurs. Il est considere comme destructif, sauf stipulation contraire dans la specification applicable. Le contenu des corrigenda de janvier 2003 et daout 2003 a ete pris en consideration dans cet exemplaire.