Active standard | Published: 10/04/2019

IEC 60749-18-ed.2.0

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 18: Rayonnements ionisants (dose totale))

Available languages: English and French

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Detail information

Designation: IEC 60749-18-ed.2.0

Publication date: 10/04/2019

Pages: 0

Country: International technical standard

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Anotation

IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: - updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing; - addition of a Bibliography, which includes ASTM standards relevant to this test method. L’IEC 60749-18:2019 presente une procedure d’essai permettant de definir les exigences pour soumettre a essai des circuits integres a semiconducteurs sous boitier et des dispositifs discrets a semiconducteurs, concernant les effets des rayonnements ionisants (dose totale) provenant d’une source de rayons gamma au cobalt-60 (60Co). D’autres sources de rayonnements appropriees peuvent etre utilisees. Le present document ne concerne que les irradiations continues et ne s’applique pas aux irradiations pulsees. Il est destine aux applications des domaines militaire et aerospatial. Il s’agit d’un essai destructif. Cette edition inclut les modifications techniques majeures suivantes par rapport a l’edition precedente: - mises a jour apportees aux paragraphes afin de mieux aligner la methode d’essai avec la methode 1019 du document MIL-STD 883J, comprenant l’utilisation de l’essai de sensibilite accrue au faible debit de dose (ELDRS); - ajout d’une bibliographie, comprenant les normes ASTM correspondant a la presente methode d’essai.

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