IEC 60749-2-ed.1.0

Detail information

Designation: IEC 60749-2-ed.1.0

Publication date: 12/04/2002

Pages: 11

Country: International technical standard

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Anotation

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy. Decrit lessai de basse pression atmospherique applique aux dispositifs a semiconducteurs. Lessai est essentiellement destine a determiner la capacite des elements et des materiaux des composants a eviter les claquages provoques par la rigidite dielectrique amoindrie de lair et des autres materiaux isolants a des pressions reduites nest applicable quaux dispositifs dont la tension de fonctionnement depasse 1 000 V. Cet essai est applicable a tous les dispositifs a semiconducteurs qui sont installes dans des boitiers pourvus de cavites internes. Cet essai est uniquement destine aux applications militaires et spatiales. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.