Active standard | Published: 13/02/2003

IEC 60749-36-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 36: Acceleration constante)

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Detail information

Designation: IEC 60749-36-ed.1.0

Publication date: 13/02/2003

Pages: 7

Country: International technical standard

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Anotation

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. Decrit un essai utilise pour determiner les effets dacceleration constante sur les dispositifs a semiconducteurs de type a cavite. Il sagit dun essai accelere destine a indiquer les types de faiblesses structurelles et mecaniques non necessairement detectees dans les essais de chocs et de vibrations.

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