IEC 60891-ed.3.0

Detail information

Designation: IEC 60891-ed.3.0

Publication date: 27/10/2021

Pages: 71

Country: International technical standard

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Anotation

IEC 60891:2021 defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics (also known as I-V curves) of photovoltaic (PV) devices. It also defines the procedures used to determine factors relevant to these corrections. Requirements for I-V measurement of PV devices are laid down in IEC 60904-1 and its relevant subparts. This third edition cancels and replaces the second edition published in 2009. This edition includes the following significant technical changes with respect to the previous edition: - adds guidance on which correction procedure shall be used depending on application; - introduces translation procedure 4 applicable to c-Si technologies with unknown temperature coefficients; - introduces various clarifications in existing procedures to improve measurement accuracy and reduce measurement uncertainty; - adds an informative annex for supplementary methods that can be used for series resistance determination. The content of the corrigendum 1 (2024-10) has been included in this copy. IEC 60891:2021 definit des procedures a suivre pour les corrections en fonction de la temperature et de leclairement appliquees aux caracteristiques I-V (courant-tension) mesurees (egalement appelees courbes I-V) des dispositifs photovoltaiques (PV). Il definit egalement les procedures utilisees pour determiner les facteurs appropries pour ces corrections. Les exigences pour le mesurage I-V des dispositifs PV sont donnees dans lIEC 60904-1 et ses sous-parties applicables. Cette troisieme edition annule et remplace la deuxieme edition parue en 2009. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: - ajout de recommandations concernant la procedure de correction a utiliser selon lapplication; - introduction de la procedure de transposition 4 applicable aux technologies c-Si avec des coefficients de temperature inconnus; - introduction de differentes classifications dans les procedures existantes afin dameliorer la precision de mesure et de reduire lincertitude de mesure; - ajout dune annexe informative qui presente des methodes supplementaires qui peuvent etre utilisees pour determiner la resistance-serie. Le contenu du corrigendum 1 (2024-10) a ete pris en consideration dans cet exemplaire.