IEC 60904-4-ed.2.0

Detail information

Designation: IEC 60904-4-ed.2.0

Publication date: 12/11/2019

Pages: 59

Country: International technical standard

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Anotation

IEC 60904-4:2019 sets the requirements for calibration procedures intended to establish the traceability of photovoltaic (PV) reference devices to SI units as required by IEC 60904-2. This document applies to PV reference devices that are used to measure the irradiance of natural or simulated sunlight for the purpose of quantifying the performance of PV devices. The use of a PV reference device is required in many standards concerning PV (e.g. IEC 60904-1 and IEC 60904-3). This document has been written with single-junction PV reference devices in mind, in particular crystalline silicon, but it is sufficiently general to include other single-junction technologies. This second edition cancels and replaces the first edition published in 2009. This edition includes the following significant technical changes with respect to the previous edition: modification of standard title; - inclusion of working reference in traceability chain; - update of WRR with respect to SI; - revision of all methods and their uncertainties in annex - harmonization of symbols and formulae with other IEC standards. The contents of the corrigendum of September 2020 have been included in this copy. L’IEC 60904-4:2019 fixe les exigences relatives aux procedures detalonnage dans le but detablir la tracabilite des dispositifs photovoltaiques (PV) de reference en unites SI, comme cela est exige par l’IEC 60904-2. Le present document sapplique aux dispositifs PV de reference utilises pour mesurer leclairement energetique de la lumiere solaire naturelle ou simulee afin de quantifier les performances des dispositifs PV. Lutilisation dun dispositif PV de reference est exigee dans de nombreuses normes relatives aux dispositifs PV (par exemple, l’IEC 60904-1 et l’IEC 60904-3). Le present document a ete redige en prenant en consideration les dispositifs PV de reference a jonction unique, en particulier le silicium cristallin, mais il est suffisamment general pour inclure d’autres technologies a jonction unique. Cette deuxieme edition annule et remplace la premiere edition parue en 2009. Cette edition inclut les modifications techniques majeures suivantes par rapport a l’edition precedente: - modification du titre de la norme; - incorporation de la reference de travail a la chaine de tracabilite; - mise a jour de la WRR (world radiometric reference - reference radiometrique mondiale) par rapport au SI; - revision de toutes les methodes et de leurs incertitudes a l’annexe: - harmonisation des symboles et formules avec les autres normes IEC. Le contenu du corrigendum de septembre 2020 a ete pris en consideration dans cet exemplaire.