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Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
Designation: IEC 61000-4-36-ed.2.0
Publication date: 23/03/2020
Pages: 108
Country: International technical standard
IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - addition of a hyperband and mesoband radiated transients immunity test method in - Annex H; - addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I. IEC 61000-4-36:2020 is available as IEC 61000-4-36:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - addition of a hyperband and mesoband radiated transients immunity test method in - Annex H; - addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I.