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Active standard | Published: 03/09/2021
IEC 62047-40-ed.1.0
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
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Detail information
Designation: IEC 62047-40-ed.1.0
Publication date: 03/09/2021
Pages: 11
Country: International technical standard
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IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.Popular Publishers
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