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Active standard | Published: 18/07/2006
IEC 62373-ed.1.0
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
(Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET))
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 104.00 EUR
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Detail information
Designation: IEC 62373-ed.1.0
Publication date: 18/07/2006
Pages: 27
Country: International technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET) Fournit une procedure dessai pour la stabilite de temperature en polarisation (essai BT) des MOSFET (transistor a effet de champ metaloxyde-semiconducteurs)Popular Publishers
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