IEC 62433-6-ed.1.0

Detail information

Designation: IEC 62433-6-ed.1.0

Publication date: 22/09/2020

Pages: 110

Country: International technical standard

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Anotation

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML. LIEC 62433-6:2020 a pour objet de decrire la methode dextraction d’un macromodele dimmunite dun circuit integre aux decharges electrostatiques (DES) conduites selon lIEC 61000-4-2 et aux transitoires electriques rapides (TER) selon lIEC 61000-4-4. Le modele couvre les dommages physiques dus a la surtension, les dommages thermiques et d’autres modes de defaillance. Les defaillances fonctionnelles peuvent egalement etre traitees par ce modele. Ce modele permet de simuler limmunite du circuit integre dans une application. Ce modele est communement appele "modele dimmunite des circuits integres – immunite aux impulsions conduites" (ICIM-CPI – integrated circuit immunity model conducted pulse immunity). Le present document fournit: - la description des elements de macromodele ICIM-CPI representant le comportement electrique, thermique ou logique du circuit integre; - un format universel dechange de donnees fonde sur le langage XML.