IEC 62496-2-4-ed.1.0

Detail information

Designation: IEC 62496-2-4-ed.1.0

Publication date: 18/06/2013

Pages: 41

Country: International technical standard

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Anotation

IEC 62496-2-4:2013 specifies the test method to decide whether to pass or fail an optical circuit board using direct illumination by a light. The input ports are directly illuminated and the optical intensity from the output ports of the optical circuit board is monitored using an area image sensor. Excess optical losses are the calculated from total detected intensities of light from a sample to be measured and from a control sample. This method is used to illuminate uniformly the input port of the optical circuit board (OCB) with a larger area than the core area, obtain the radiance of an area image from the corresponding output port of the OCB using an area image sensor, and evaluate whether to pass or fail using the radiance obtained compared to that of a control sample. The advantage of this test method is that the alignment procedure between a launch fibre and the OCB is not necessary. Key words: test method to decide whether to pass or fail an optical circuit board, OCB, area image sensor La CEI 62496-2-4:2013 specifie la methode dessai utilisee pour determiner lacceptation ou le rejet dune carte a circuits optiques en la soumettant a leclairement direct dune lampe. On soumet les ports dentree a un eclairage direct et on surveille lintensite optique issue des ports de sortie de la carte a circuits optiques a laide dun capteur dimage bidimensionnel. On calcule ensuite les affaiblissements optiques excedentaires a partir de la somme des intensites lumineuses detectees sur un echantillon a mesurer et sur un echantillon temoin. Cette methode permet declairer uniformement le port dentree de la carte a circuits optiques (OCB) sur une surface superieure a celle du c ur, dobtenir la luminance de limage bidimensionnelle issue du port de sortie correspondant de lOCB a laide dun capteur dimage bidimensionnel, et devaluer sil faut accepter ou rejeter la carte en comparant la luminance obtenue a celle dun echantillon temoin. Cette methode dessai a pour avantage de ne pas necessiter dalignement entre une fibre dinjection et lOCB. Mots cles: essai utilisee pour determiner lacceptation ou le rejet dune carte a circuits optiques, OCB, capteur dimage bidimensionnel