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Active standard | Published: 07/11/2007
IEC 62525-ed.1.0
Standard Test Interface Language (STIL) for Digital Test Vector Data
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 554.80 EUR
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Detail information
Designation: IEC 62525-ed.1.0
Publication date: 07/11/2007
Pages: 143
Country: International technical standard
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You can buy at www.mystandards.bizAnotation
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.Popular Publishers
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