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Active standard | Published: 07/11/2007
IEC 62526-ed.1.0
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
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Detail information
Designation: IEC 62526-ed.1.0
Publication date: 07/11/2007
Pages: 123
Country: International technical standard
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You can buy at www.mystandards.bizAnotation
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.Popular Publishers
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