IEC 62836-ed.1.0

Detail information

Designation: IEC 62836-ed.1.0

Publication date: 28/02/2024

Pages: 93

Country: International technical standard

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Anotation

IEC 62836:2024 provides an efficient and reliable procedure to test the internal electric field in the insulating materials used for high-voltage applications, by using the pressure wave propagation (PWP) method. It is suitable for a planar and coaxial geometry sample with homogeneous insulating materials of thickness larger or equal to 0,5 mm and an electric field higher than 1 kV/mm, but it is also dependent on the thickness of the sample and the pressure wave generator. This first edition cancels and replaces IEC TS 62836 published in 2020. This edition includes the following significant technical changes with respect to IEC TS 62836: a) addition of Clause 12 for the measurement of space charge distribution in a planar sample; b) addition of Clause 13 for coaxial geometry samples; c) addition of Annex D with measurement examples for coaxial geometry samples; d) addition of a Bibliography; e) measurement examples for a planar sample have been moved from Clause 12 in IEC TS 62836 to Annex C. L’IEC 62836 :2024 fournit une procedure efficace et fiable pour evaluer le champ electrique interne dans les materiaux isolants utilises pour les applications a haute tension, par la methode de londe de pression (PWP). Cette methode convient aux echantillons a geometrie plane et coaxiale constitues de materiaux isolants homogenes dune epaisseur superieure ou egale a 0,5 mm et aux champs electriques superieurs a 1 kV/mm, mais elle depend egalement de lepaisseur de lechantillon et du generateur dondes de pression. Cette premiere edition annule et remplace lIEC TS 62836 parue en 2020. Cette edition inclut les modifications techniques majeures suivantes par rapport a lIEC TS 62836: a) ajout de lArticle 12 relatif au mesurage de la repartition des charges despace sur un echantillon plan; b) ajout de lArticle 13 relatif aux echantillons a geometrie coaxiale; c) ajout de lAnnexe D qui fournit des exemples de mesurages sur des echantillons a geometrie coaxiale; d) ajout dune Bibliographie; e) les exemples de mesurages sur un echantillon plan ont ete deplaces de lArticle 12 de lIEC TS 62836 a lAnnexe C.