Active standard | Published: 17/04/2019

IEC 62951-2-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
(Dispositifs a semiconducteurs - Dispositifs a semiconducteurs souples et extensibles - Partie 2 : Methode d’evaluation pour la mobilite des electrons, la pente en regime de sous-seuil et la tension de seuil des dispositifs souples)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 58.50 USD show on eshop

Detail information

Designation: IEC 62951-2-ed.1.0

Publication date: 17/04/2019

Pages: 21

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status. L’IEC 62951-2:2019 specifie les termes, definitions, symboles, configurations et methodes d’evaluation pouvant etre utilises pour evaluer et determiner les caracteristiques de performance des dispositifs a transistors en couche mince (TFT) souples. Le present document specifie les methodes d’essai et les parametres caracteristiques permettant d’evaluer precisement, dans le cadre d’une utilisation pratique, la performance et la fiabilite des dispositifs TFT souples soumis a une contrainte de courbure.

Popular Publishers

full catalog