Active standard | Published: 06/05/2019

IEC 62951-6-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
(Dispositifs a semiconducteurs - Dispositifs a semiconducteurs souples et extensibles - Partie 6: Methode d’essai pour la resistance de couche des couches conductrices souples)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 234.10 USD show on eshop

Detail information

Designation: IEC 62951-6-ed.1.0

Publication date: 06/05/2019

Pages: 0

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance. L’IEC 62951-6:2019 specifie les termes, ainsi que la methode et le rapport d’essai de la resistance de couche d’une couche conductrice souple soumise a des essais de courbure et de pliage. Les methodes de mesurage comprennent la methode de la sonde 2 points, la methode de la sonde 4 points et la methode de Montgomery, qui peuvent etre appliquees a un mesurage sur site ou hors site et aux mesurages de resistance de couche anisotrope.

Popular Publishers

full catalog