Active standard | Published: 28/11/2025

IEC 63616-ed.1.0

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
(Mesurage de la conductivite des films minces metalliques aux hyperfrequences et aux frequences a ondes millimetriques - Methode du resonateur a disque circulaire de type symetrique)

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Detail information

Designation: IEC 63616-ed.1.0

Publication date: 28/11/2025

Pages: 26

Country: International technical standard

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Anotation

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator. LIEC 63616:2025 traite d’une methode de mesurage de la conductivite de films metalliques minces aux hyperfrequences et aux frequences a ondes millimetriques. Cette methode a ete elaboree pour evaluer la conductivite d’une feuille metallique utilisee pour adherer a un substrat ou la conductivite interfaciale d’une couche metallique formee sur un substrat dielectrique. Elle utilise des modes d’ordre superieur d’un resonateur a disque circulaire de type symetrique et permet d’effectuer, a l’aide d’un seul resonateur, des mesurages de conductivite a large bande.

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