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Withdrawn | Published: 09/12/2007
IEEE/IEC 62528-2007 Withdrawn
IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 337.10 EUR
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Detail information
Designation: IEEE/IEC 62528-2007
Publication date: 09/12/2007
Pages: 0
Note: Withdrawn
Country: International technical standard
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