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Withdrawn | Published: 13/12/1991
IEEE 1181-1991 Withdrawn
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
Available languages: English
Available design: electronic (protected pdf) - Immediate download
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Detail information
Designation: IEEE 1181-1991
Publication date: 13/12/1991
Pages: 0
Note: Withdrawn
Country: International technical standard
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