Active standard | Published: 27/01/2017

IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

Available languages: English

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Detail information

Designation: IEEE 1445-2016

Publication date: 27/01/2017

Pages: 64

Country: International technical standard

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Anotation

Revision Standard - Active.
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

ISBN: 978-1-5044-3691-5, 978-1-5044-3692-2
Number of Pages: 64
Product Code: STD22392, STDPD22392
Keywords: automatic test equipment, ATE, DATPG, digital automated test program generator, digital test interchange format, DTIF, fault dictionary data, IEEE 1445(TM)
Category: Test Instrumentation and Techniques|General/Other - General Interests

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