IEEE 1687-2014

Detail information

Designation: IEEE 1687-2014

Publication date: 05/12/2014

Pages: 283

Country: International technical standard

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Anotation

New IEEE Standard - Active.
A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

ISBN: 978-0-7381-9416-5, 978-0-7381-9417-2
Number of Pages: 283
Product Code: STD20033, STDPD20033
Keywords: access network, built-in self-test (BIST), boundary scan, debug, design for testability (DFT), embedded instruments, IEEE 1149.1(TM), IEEE 1687(TM), Instrument Connectivity Language (ICL), internal JTAG (IJTAG), Joint Test Action Group (JTAG), on-chip instrumentation, Procedural Description Language (PDL), test, Tool Command Language (Tcl)
Category: Test Technology