Active standard | Published: 09/01/2026

IEEE 2427-2025

IEEE Standard for Analog Defect Modeling and Coverage

Available languages: English

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Detail information

Designation: IEEE 2427-2025

Publication date: 09/01/2026

Pages: 112

Country: International technical standard

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Anotation

New IEEE Standard - Active.
A defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs) is defined in this standard. The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified and dozens of commonly used terms are clearly defined to aid communication about the quality of tested ICs.

ISBN: 979-8-8557-2776-0, 979-8-8557-2777-7
Number of Pages: 112
Product Code: STD28383, STDPD28383
Keywords: AMS test, analog/mixed-signal test, analog test coverage, defect coverage, defective parts per million, design for test, DFT, DPPM, IEEE 2427(TM)
Category: Test Instrumentation and Techniques|Test Technology

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