Active standard | Published: 16/10/2024

ISO 19214:2024-ed.2.0

Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
(Titre manque)

Available languages: English

Available design: electronic design (pdf), Print design

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Detail information

Designation: ISO 19214:2024-ed.2.0

Publication date: 16/10/2024

Pages: 20

Country: International technical standard

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Anotation

Description / Abstract: This document gives a method for determination of the apparent growth direction of nanocrystals by transmission electron microscopy. This method is applicable to all kinds of wire-like crystalline materials synthetized by various methods. This document can also guide in determining an axis direction of the second-phase particles in steels, alloys, or other materials. The applicable diameter or width of the crystals to be tested is in the range of tens to one hundred nanometres, depending on the accelerating voltage of the transmission electron microscope (TEM) and the material itself. Position, which is curved, twisted, and folded, to determine the apparent growth direction, should not be used.

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