Active standard | Published: 29/01/2020

ISO 21222:2020

Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
(Analyse chimique des surfaces — Microscopie a sonde locale — Lignes directrices pour la détermination des modules d’élasticité des matériaux souples en utilisant un microscope a force atomique)

Available languages: English

Available design: electronic design (pdf), Print design

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Detail information

Designation: ISO 21222:2020

Publication date: 29/01/2020

Pages: 17

Country: International technical standard

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Anotation

Description / Abstract: This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

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