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Active standard | Published: 22/03/2011
JIS K0167:2011
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Available languages: Japanese
Available design: electronic design (pdf), Print design
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Detail information
Designation: JIS K0167:2011
Publication date: 22/03/2011
Pages: 26
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