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Active standard | Published: 21/10/2024
JIS K0183:2024
Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 174 996.00 CZK
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Detail information
Designation: JIS K0183:2024
Publication date: 21/10/2024
Pages: 22
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