Active standard | Published: 01/09/2014

SAE SSB1_002

Environmental Tests and Associated Failure Mechanisms

Available languages: English

Available design: electronic design (pdf), Print design

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Detail information

Designation: SAE SSB1_002

Publication date: 01/09/2014

Pages: 0

Country: American technical standard

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Anotation

This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications.

This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.

SUBJECT TAXONOMY: Electrical systems, Plastics, Semiconductors
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard

Stabilized: Sep 2014 SAE - Standards Status Definitions