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Active standard | Published: 01/12/2000
STN EN 60444-2
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Available languages: English
Available design: Print design
Detail information
Designation: STN EN 60444-2
Publication date: 01/12/2000
Pages: 12
Country: Slovak technical standard
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