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Active standard | Published: 01/04/2017
STN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Available languages: English
Available design: Print design
Detail information
Designation: STN EN 60749-44
Publication date: 01/04/2017
Pages: 0
Country: Slovak technical standard
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