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Active standard | Published: 01/07/2022
STN EN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Available languages: English
Available design: Print design
Detail information
Designation: STN EN IEC 60749-28
Publication date: 01/07/2022
Pages: 0
Country: Slovak technical standard
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