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Active standard | Published: 01/07/2017
UNE-EN 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Espanola de Normalización in July of 2017.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 60749-3:2017
Publication date: 01/07/2017
Pages: 21
Country: Spanish technical standard
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