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Active standard | Published: 16/03/2005
UNE-EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 45.10 USD
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Detail information
Designation: UNE-EN 60749-33:2005
Publication date: 16/03/2005
Pages: 17
Country: Spanish technical standard
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