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Active standard | Published: 01/07/2017
UNE-EN 60749-4:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Espanola de Normalización in July of 2017.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 149.90 CZK
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Detail information
Designation: UNE-EN 60749-4:2017
Publication date: 01/07/2017
Pages: 19
Country: Spanish technical standard
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