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Active standard | Published: 01/09/2010
UNE-EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 62417:2010
Publication date: 01/09/2010
Pages: 11
Country: Spanish technical standard
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